Focus on Advanced Scanning Probe Microscopy (ASPM): Applications in Materials Science

Guest editors

Kehui Wu

Institute of Physics, Chinese Academy of Sciences, China

Ying Jiang

International Centre for Quantum Materials, Peking University, China


2021 marks the 40th anniversary of the advent of scanning tunnelling microscopy (STM). The invention of the scanning tunnelling microscopy directly gave birth to the vigorous development of nanoscience. A series of scanning probe microscopy families developed on this basis have become powerful tools for studying the structure and properties of materials as well as the rich quantum physics in low dimensions. The main purpose of this focus issue is to promote the interdisciplinary research of advanced SPM techniques and materials science.  We invite scientific researchers both fields to explore the cutting-edge development directions of SPMs, and major material science issues that may be resolved by scanning probe technology. 

Topics of interest: 

  • Cutting-edge development of SPM techniques, which will be potentially useful in the study of materials and condensed matter physics. For examples, ultra-low temperature and high magnetic field STM, spin-polarized STM, non-contact AFM, the combination of SPM with Raman, MicrowaveTerahertzUltrafast Pulsed-Laser and so on.

  • Application of advanced SPM techniques in the study of materials and condensed matter physics, including (but not limited to) topological materials, 2D materials, magnetic and multiferroic materials, soft materials, bio-materials, MOF, COF, and material chemistry.

Submission process

Focus issue articles are subject to the same review process and high standard as regular Materials Futures articles and should be submitted in the same way. Peer review will be organized immediately upon receipt of the submission and will be published online once it is accepted.

For more comprehensive information on preparing your article for submission and the options for submitting your article, please see our Author guidelines.

Articles should be submitted via the online submission form and select “Focus on Advanced Scanning Probe Microscopy (ASPM): Applications in Materials Science” in the 'Select Special Issue' drop down box that appears.

Deadline for submissions

June 30, 2022

Article charge

All articles in Materials Futures are published on an open access basis. Article publication charges are waived for authors from 2022 to 2024.

    Atomically constructing a van der Waals heterostructure of CrTe2/Bi2Te3 by molecular beam epitaxy

    Advanced scanning probe techniques and materials research

    Advances in bismuth-based topological quantum materials by scanning tunneling microscopy

    Scanning Probe Microscopy in Probing Low-Dimensional Carbon-Based Nanostructures and Nanomaterials

    Advanced atomic force microscopies and their applications in two-dimensional materials: a review