Citation: | Rui Xu, Jianfeng Guo, Shuo Mi, Huanfei Wen, Fei Pang, Wei Ji, Zhihai Cheng. Advanced atomic force microscopies and their applications in two-dimensional materials: a review[J]. Materials Futures, 2022, 1(3): 032302. doi: 10.1088/2752-5724/ac8aba |
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